ASSET - Solutions Beyond ICT
Non-intrusive software-based test methods deliver test coverage beyond the reach of legacy probes and bed-of-nails testers. ASSET white paper explores solutions for diminishing test coverage from in-circuit test (ICT) systems.
From the press release:
A new white paper from ASSET® InterTech explains why test coverage from intrusive, probe-based in-circuit testers with their bed-of-nails fixtures is diminishing. The paper also describes software-based non-intrusive methodologies that test from the inside out and eliminate the need to physically probe chips and circuit boards during prototype board bring-up, volume manufacturing and troubleshooting in the field.
The new white paper is titled “Solving the problem of diminishing test coverage from in-circuit test (ICT)” by Adam Ley, chief technologist of non-intrusive board test for ASSET.
To read the full press release and download the white paper - click the web icon.