ASSET ScanWorks FPGA named Best in Test

From the press release:

Two new instruments for ASSET® InterTech’s ScanWorks® platform for embedded instruments have been named finalists by Test & Measurement World in its 2013 Best in Test awards program. ASSET’s instrumentation intellectual property (IP) supports the new IEEE P1687 Internal JTAG (IJTAG) standard for embedded instruments.

The ScanWorks FPGA-controlled test (FCT) toolkit is the first to automatically insert multiple instruments into an FPGA, configure and connect the instruments as a cohesive board-tester-in-a-chip, and operate the tester from an intuitive drag-and-drop interface. The two embedded instruments named Best in Test finalists involve testing on-board memory. One is a DDR2/DDR3 memory link tester and the second instrument is a generic memory test instrument.