Platform for Embedded Instrumentation
The multiple non-intrusive tools that make up ScanWorks let you validate, test and debug your chips and circuit boards from the inside out.
BST - Boundary Scan/JTAG Test
JTAG Boundary-Scan Test (BST) is optimized for ease and speed of use, high test coverage, long-term reliability and protection of boards under test. Its automated, model-based test development drastically cuts lead times. And the tests you build in one phase can be re-used in the next. It's a single, unified workflow.
PCT - Processor Controlled Test
Processor-Controlled Test (PCT) takes advantage of the CPU’s debug port for access to the circuit board so it can perform board debug, device initialization, at-speed functional test with structural diagnostics and much more. PCT is just one of several ScanWorks tools which address every stage in a product’s life cycle.
HSIO/Intel® IBIST Test
High Speed I/O (HSIO) validation capitalizes on instrumentation already embedded on circuit boards and in chips, such as the Intel® Interconnect Built-In Self Test (IBIST) embedded instrumentation technology. HSIO monitors the signaling on a bus from the inside out and shows you the very signal that the receiver is seeing.
IJTAG - Internal JTAG
The Internal JTAG (IJTAG) tools allow system-on-a-chip (SoC) designers, DFT engineers and validation engineers a new and simpler way to access, control and run any embedded instrument designed into chips. The ratified IEEE 1687 Standard defines a scaleable and reusable methodology to operate embedded instruments.
FCT - FPGA-Controlled Test
FPGA-Controlled Test (FCT) is another non-intrusive board test (NBT) technology for the ScanWorks platform for embedded instruments. ScanWorks FCT and the platform’s other NBT technologies give you the kind of test coverage and visibility into your circuit board that legacy external probe-based testers cannot.